Currently, for the research on the energy density of dielectric energy storage materials, the conventional method is to calculate the energy density of materials under high voltage through hysteresis loops. During testing, the charge of the sample is returned to the high - voltage source instead of being released to the load. The energy storage density measured by hysteresis loops is generally higher than the actual energy density released by the sample, which makes it impossible to correctly evaluate the normal discharging performance of dielectric materials. Therefore, the most direct and reliable method is to obtain the capacitance discharging curve of the sample.

Our company has launched the CFD - 003 type dielectric charging and discharging testing system, which is specially designed for studying the rapid charging and discharging performance of energy storage dielectric materials. It is suitable for ceramic and thin - film materials and can perform under - damping, over - damping tests at variable temperatures as well as fatigue charging and discharging tests (when used in conjunction with a heating/cooling stage).