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GoGo Instruments Custom Optical Heating Stage for Crystal Sample Testing

GoGo Instruments Technology (Shanghai) Co., Ltd. specializes in temperature control technology. We possess a range of patented products including probe heating/cooling stages, optical heating/cooling stages, in-situ stretching stages, in-situ XRD/SEM heating/cooling stages, ultra-high temperature stages, high and low temperature test chambers, as well as test systems for dielectric spectroscopy, electrocaloric effect, charge-discharge testing, and temperature-dependent d33 measurement.


Responding to client requirements, GoGo Instruments customized an optical heating stage for Anhui University, intended for on-site testing of crystal samples. This custom optical heating stage is designed for researching the temperature-dependent optical properties of samples, enabling the characterization of how their optical performance changes with temperature. The product utilizes resistance heating to achieve precise control within the range of RT to 400°C. It can be integrated with other optical equipment (such as microscopes, Raman spectrometers, etc.) for in-situ variable temperature testing.


The optical heating stage needs to be used with a temperature controller. The accompanying PC-based temperature control software facilitates easy temperature setting and data acquisition. Provided LabVIEW VIs allow customers to perform customized programming.


↑ Custom Optical Heating Stage for Anhui University by GoGo Instruments ↑


Key Product Technical Parameters:

1. Temperature Range: RT to 400°C

2. Temperature Control Accuracy/Stability: ±0.1°C

3. Heating Rate: 0.1~30°C/min

4. Window Size: Φ25mm

5. Objective Working Distance: 5mm

6. Sample Size: 20*20mm

7. Sample Stage Material: 99.99% Silver

8. Sample Chamber Height: 4mm

9. Temperature Sensor: PT100

10. Optical Path: Transmission

11. Chamber: Vacuum and Gas-tight compatible

12. Housing Cooling: Circulating Water


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↑ Optical Heating Stage Integrated with Microscope for On-site Crystal Sample Testing ↑

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