GoGo Instruments Technology (Shanghai) Co., Ltd. specializes in temperature control technology, offering a range of patented products including probe heating/cooling stages, optical heating/cooling stages, in situ stretching stages, in situ XRD/SEM heating/cooling stages, ultra-high-temperature heating stages, and high/low-temperature test chambers, as well as testing systems for dielectric thermal spectra, electrocaloric effects, charge-discharge testing, and variable-temperature D33 measurements.

According to customer requirements, GoGo Instruments customized an electrical heating/cooling stage for Hangzhou Dianzi University to conduct on-site temperature-controlled testing of silicon wafer samples. This customized electrical heating/cooling stage is designed for studying the electrical properties of samples under variable temperature conditions, capable of characterizing how the electrical performance of samples changes with temperature. The customized product utilizes resistance heating and liquid nitrogen cooling to achieve precise temperature control within the range of -190°C to 400°C. It can be integrated with other electrical instruments (such as LCR meters, source meters, multimeters, etc.) for in-situ variable temperature testing.

The product requires accessories use with a temperature controller and cooling controller (optional). The accompanying PC-based temperature control software facilitates temperature setting and data acquisition, while provided LabVIEW VIs enable customers to perform customized programming.

Main Technical Parameters:

1.Dimensions: 100*100*25mm

2.Temperature Range: -190°C to 400°C 3.Temperature Resolution: 0.1°C

4.Temperature Control Accuracy: ±0.1°C (±0.3°C for -190°C to -120°C)

5.Temperature Sensor Type: PT100

6.Housing Material: Aluminum Alloy

7.Viewport Size: φ25mm (optional)

8.Viewport Material: Quartz Glass

9.Sample Stage Size: 23*23mm

10.Sample Stage Material: Pure Silver

11.Optical Path: Reflective

12.Housing Cooling: Circulating Water

13.Chamber: Vacuum, compatible with atmosphere chamber

14.Objective Distance: ≤7mm from sample upper surface to viewport upper surface

15.Electrical Interface: Vacuum triaxial BNC. Four internal columns connect to BNC interfaces, with copper upper sections for soldering sample leads. Current measurement capability down to pA level.

↑ Customized Electrical Heating/Cooling Stage by GoGo Instruments conducting on-site testing at Hangzhou Dianzi University. Test sample: silicon wafer ↑