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Customized Dielectric Charge-Discharge Testing System for Bulk Ceramic Samples Under Variable Temperatures

GoGo Instruments Technology (Shanghai) Co., Ltd. specializes in temperature control technology, offering a range of patented products including probe heating/cooling stages, optical heating/cooling stages, in situ stretching stages, in situ XRD/SEM heating/cooling stages, ultra-high-temperature heating stages, and high/low-temperature test chambers, as well as testing systems for dielectric thermal spectra, electrocaloric effects, charge-discharge testing, and variable-temperature D33 measurements.


The Dielectric Charge-Discharge Testing System is primarily used to study the high-voltage discharge performance of dielectric energy storage materials.

Conventional methods currently calculate the energy density of dielectrics under high voltage through hysteresis loops. During testing, the charge from the sample is returned to the high-voltage source rather than released to a load. The energy storage density measured via hysteresis loops is generally greater than the actual energy density released by the sample, making it impossible to correctly evaluate the normal discharge performance of dielectric materials.


The GoGo Instruments Energy Storage Dielectric Charge-Discharge Testing System is designed to study the fast charge-discharge performance of energy storage dielectric materials. It is suitable for ceramic and thin-film materials and can perform under-damped and over-damped charge-discharge tests under variable temperatures. It is an important scientific research equipment for studying energy storage materials.


According to customer requirements, GoGo Instruments customized a Dielectric Charge-Discharge Testing System (CFD-005) for Huangshan University to perform variable temperature charge-discharge tests on bulk ceramic samples, investigating the charge-discharge rate and energy storage density of ceramic electrolyte materials.


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Product Features:

1. The system uses a special high-voltage switch controlled by a single-pole double-throw mechanism to manage charging and discharging processes. The switch can withstand 10kV high voltage, has low parasitic capacitance, and short action time;
2. Maximum voltage: 10kV, current: 5mA;
3. Discharge current is detected via a current probe, capable of measuring up to 100A;
4. Supports two testing modes: under-damped and over-damped. In under-damped testing, the discharge circuit is shorted without using a resistive load. In over-damped testing, a large, high-precision non-inductive resistor is used as the discharge load;
5. Data acquisition via oscilloscope with direct calculation of energy storage density;
6. Customized loading platform suitable for testing both ceramic and thin-film samples;
7. Variable temperature testing capability: RT-200°C;
8. Fatigue testing capability.


Main Parameters:

1. Current Probe Bandwidth: 120MHz;
2. Peak Current: 0-100A, 150A (multiple current ranges available);
3. Current Acquisition Accuracy: 1mA;
4. High-Voltage Source Module: Optional 3KV, 5KV, 10kV, 15KV (Current: 0-5mA);
5. Switch Durability: 1 million cycles, Withstand Voltage 15kV;
6. Temperature Control Range: 0-200°C;
7. Temperature Stability and Accuracy: 0.1°C;
8. Test Samples: Thin films, thick films, ceramics, glass, etc.;
9. Compatible with various polarization devices for testing multiple types of piezoelectric and dielectric materials.


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↑ GoGo Instruments Dielectric Charge-Discharge Testing System conducting on-site testing for ceramic materials at Huangshan University ↑


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